Structural characterization of gamma irradiated ZnS thin films

Authors

Nadir Fadhil Habubi
Mustafa Shakir Hashim
Amal Yousif Al-Yasiri

Abstract

The effects of gamma irradiation on the structure of ZnS films , which preparing by flash evaporation method, are studied using XRD. Two peaks of (111), (220) orientations are appeared in X ray chart indicating the cubic phase of the films .The lattice parameter, grain size, average internal stress, microstrain, dislocation density and degree of preferred orientation in the film are calculated and correlated with gamma irradiation.

Article Type

Article

How to Cite this Article

Habubi, Nadir Fadhil; Hashim, Mustafa Shakir; and Al-Yasiri, Amal Yousif (2010) "Structural characterization of gamma irradiated ZnS thin films," Baghdad Science Journal: Vol. 7: Iss. 4, Article 26.
DOI: https://doi.org/10.21123/bsj.2010.11935