Abstract
The reliability of optical sources is strongly dependent on the degradation and device characteristics are critically dependent on temperature. The degradation behaviours and reliability test results for the laser diode device (Sony-DL3148-025) will be presented .These devices are usually highly reliable. The degradation behaviour was exhibited in several aging tests, and device lifetimes were then estimated. The temperature dependence of 0.63μm lasers was studied. An aging test with constant light power operation of 5mW was carried out at 10, 25, 50 and 70°C for 100hours. Lifetimes of the optical sources have greatly improved, and these optical sources can be applied to various types of transmission systems. Within this degradation range, the device life for system application is estimated to be more than 100 h at 70 ºC at a constant power of 5mW.
Keywords
LD reliability, lifetime test, temperature characteristics, semiconductor laser
Article Type
Article
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.
How to Cite this Article
Mawlud, Saman Q.
(2012)
"Effect of Temperature on Reliability and Degradation of 0.63μm Laser Diode,"
Baghdad Science Journal: Vol. 9:
Iss.
1, Article 19.
DOI: https://doi.org/10.21123/bsj.2012.9.1.141-147
