Main Article Content
The measurement of minority carrier lifetime (MCLT) ofp-n Si fabricated with aid of laser doping technique was reported. The measurement is achieved by using open circuit voltage decay (OCVD) technique. The experiment data confirms that the value of MCLT and proftle of Voc decay were very sensitive to the doping laser energy.
Download data is not yet available.
How to Cite
Journal BS. Evaluation of Laser Doping of Si from MCLT Measurement: Raid A. Ismail |Mouslm F. Jawad |Omar A. A. Sultan|S. Yaseen. Baghdad Sci.J [Internet]. 2021Mar.8 [cited 2021Sep.21];1(2):321-5. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/567
This work is licensed under a Creative Commons Attribution 4.0 International License.