Evaluation of Laser Doping of Si from MCLT Measurement
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Abstract
The measurement of minority carrier lifetime (MCLT) ofp-n Si fabricated with aid of laser doping technique was reported. The measurement is achieved by using open circuit voltage decay (OCVD) technique. The experiment data confirms that the value of MCLT and proftle of Voc decay were very sensitive to the doping laser energy.
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Evaluation of Laser Doping of Si from MCLT Measurement. Baghdad Sci.J [Internet]. 2004 Dec. 1 [cited 2024 Nov. 13];1(2):321-5. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/567
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How to Cite
1.
Evaluation of Laser Doping of Si from MCLT Measurement. Baghdad Sci.J [Internet]. 2004 Dec. 1 [cited 2024 Nov. 13];1(2):321-5. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/567