Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique

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Ali A. Abdullah
Mazin M. Elias
Shafiq s. Shafiq

Abstract

Doppler broadening of the 511 keV positron annihilation ??? ? was used to estimate the concentration of defects ?? different deformation levels of pure alnminum samples. These samples were compressed at room temperature to 15, 22, 28, 38,40, and 75 % thickness reduction. The two-state ^sitron-trapping model has been employed. 'I he s and w lineshape parameters were measured using high-resolution gamma spectrometer with high pure germanium detector of 2.1 keV resolution at 1.33 MeV of 60Co. The change of defects concentration (Co) with the deformation level (e) is found to obey an empirical formula of the form Cd - A £ B where A and ? are positive constants that depend mainly on the deformation procedure and the temperature at which the deformation takes place.

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Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique. Baghdad Sci.J [Internet]. 2021 Mar. 8 [cited 2024 Mar. 28];1(1):149-53. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/516
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How to Cite

1.
Monitoring of Defects Concentration in Deformed Aluminum Using Doppler Broadening Technique. Baghdad Sci.J [Internet]. 2021 Mar. 8 [cited 2024 Mar. 28];1(1):149-53. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/516