Study of the electrical properties of Ion Beam Sputtered thin AlNiCo films

محتوى المقالة الرئيسي

T.K. Al-Ani

الملخص

The electrical properties of the AlNiCo thin films with thickness (1000oA) deposited on glass substrates using Ion – Beam sputtering (IBS) technique under vacuum <10-6 torr have been studied . Also it studied the effect of annealing temperature from this films , It is found that the effective energy decrease with increase of temperature and the conductivity decrease with increase temperature 323oK but after this degree the conductivity increasing .

تفاصيل المقالة

كيفية الاقتباس
1.
Study of the electrical properties of Ion Beam Sputtered thin AlNiCo films. Baghdad Sci.J [انترنت]. 1 يونيو، 2007 [وثق 30 نوفمبر، 2024];4(2):260-2. موجود في: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/795
القسم
article

كيفية الاقتباس

1.
Study of the electrical properties of Ion Beam Sputtered thin AlNiCo films. Baghdad Sci.J [انترنت]. 1 يونيو، 2007 [وثق 30 نوفمبر، 2024];4(2):260-2. موجود في: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/795