Study of the electrical properties of Ion Beam Sputtered thin AlNiCo films
محتوى المقالة الرئيسي
الملخص
The electrical properties of the AlNiCo thin films with thickness (1000oA) deposited on glass substrates using Ion – Beam sputtering (IBS) technique under vacuum <10-6 torr have been studied . Also it studied the effect of annealing temperature from this films , It is found that the effective energy decrease with increase of temperature and the conductivity decrease with increase temperature 323oK but after this degree the conductivity increasing .
تفاصيل المقالة
كيفية الاقتباس
1.
Study of the electrical properties of Ion Beam Sputtered thin AlNiCo films. Baghdad Sci.J [انترنت]. 1 يونيو، 2007 [وثق 30 نوفمبر، 2024];4(2):260-2. موجود في: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/795
القسم
article
هذا العمل مرخص بموجب Creative Commons Attribution 4.0 International License.
كيفية الاقتباس
1.
Study of the electrical properties of Ion Beam Sputtered thin AlNiCo films. Baghdad Sci.J [انترنت]. 1 يونيو، 2007 [وثق 30 نوفمبر، 2024];4(2):260-2. موجود في: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/795