Isochronal Studies of the Structural and Electrical Properties of CdTe Films
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Abstract
The paper reports the influence of annealing temperature under vacuum for one hour on the some structural and electrical properties of p-type CdTe thin films were grown at room temperature under high vacuum by using thermal evaporation technique with a mean thickness about 600nm. X-ray diffraction analysis confirms the formation of CdTe cubic phase at all annealing temperature. From investigated the electrical properties of CdTe thin films, the electrical conductivity, the majority carrier concentration, and the Hall mobility were found increase with increasing annealing temperatures.
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Isochronal Studies of the Structural and Electrical Properties of CdTe Films. Baghdad Sci.J [Internet]. 2011 Mar. 6 [cited 2024 Dec. 29];8(1):134-40. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/1145
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How to Cite
1.
Isochronal Studies of the Structural and Electrical Properties of CdTe Films. Baghdad Sci.J [Internet]. 2011 Mar. 6 [cited 2024 Dec. 29];8(1):134-40. Available from: https://bsj.uobaghdad.edu.iq/index.php/BSJ/article/view/1145